Quality

“Navitas employs an application-specific, design-driven approach to ensure the quality and reliability of our GaNFast products consistently exceeds our customers’ expectations.”

Anthony Schiro, VP Quality

Quality Performance*

GaNFast Power ICs Shipped

Device Hours in the Field

Field Failures

Field ppm

FIT Rate

Equivalent Device Hours Tested

Q

Notes

Quality and production data (actual) is reviewed at the start of each month, then shipment data incremented per estimate of production backlog.

  • GaNFast power ICs shipped: Production material only.
  • Device Hours in the Field: assumes 3-month allocation for transits, distribution and customer assembly times.
  • Field Failures: confirmed GaN-related field-use failures.
  • Field ppm: Parts per million defect ratio (# field failures / # Million units shipped)
  • FIT Rate: ‘Failures In Time’ (# Reliability Test Failures / Billion Equivalent Device Hours)
  • Equivalent Device Hours Tested: Total device hours tested x reliability acceleration factors.

Quality & Reliability Technical & White Papers

Systematic Approach to GaN Power IC Reliability

Application-Specific Reliability Testing

Founder Member JEDEC JC-70.1 Gallium Nitride, 2017

Reports & Certificates

Navitas Quality Library
TSMC
TSMC Certificate
Amkor
SGS Data Sheets